Pego Electronics (Yi Chun) Company Limited
| Payment Terms | T/T, Western Union, MoneyGram |
| Delivery Time | 7 working days |
| Packaging Details | carton |
| Standard | IEC60529, IEC61032 |
| IP Code | IP1X, IP2X, IP3X, and IP4X |
| Name | test probe A, test probe B, test probe C, test probe D, test probe 1, test probe 2 |
| Application | protection against to live part and accessiblity parts |
| Material | nylon (handle), steel (test wire, test rod, test sphere, tet finger) |
| Warranty | 1 year |
| Brand Name | PEGO |
| Model Number | IPXX |
| Certification | Third-Lab Calibration Certificate |
| Place of Origin | China |
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Product Specification
| Payment Terms | T/T, Western Union, MoneyGram | Delivery Time | 7 working days |
| Packaging Details | carton | Standard | IEC60529, IEC61032 |
| IP Code | IP1X, IP2X, IP3X, and IP4X | Name | test probe A, test probe B, test probe C, test probe D, test probe 1, test probe 2 |
| Application | protection against to live part and accessiblity parts | Material | nylon (handle), steel (test wire, test rod, test sphere, tet finger) |
| Warranty | 1 year | Brand Name | PEGO |
| Model Number | IPXX | Certification | Third-Lab Calibration Certificate |
| Place of Origin | China | ||
| High Light | ingress protection test equipment ，waterproof test equipment | ||
IEC60529 IP1X IP2X IP3X IP4X Test Finger Probe with Third-lab Calibration Certificate
1. Introduction
The IP code test probes are designed accoring to IEC60529 and IEC61032 standard. It includes test probe A (Sphere:Φ50 with handle) for IP1X test, test probe 1 (Sphere: Φ50) for IP10 test, test probe B (Jointed test finger) for IP2X test, test probe C (Rod: Φ2.5-length 100) for IP3X test, test probe D (Wire: Φ1.0-length 100) for IP4X and test probe 2 (Sphere: Φ12.5) for IP20 test. All the probes can provide with a third-lab calibration certificate which authorized by ISO17025 Lab.
2. Specification
1). Test probe A (Sphere:Φ50 with handle) for IP1X test
Test probe A ( Φ50 sphere with handle) is designed according to IEC61032 fig.1, and meet the requirements of IEC60529 regarding IP1X testing and IEC60065. This probe is intended to verify the protection of persons against access to hazardous parts. Test probe A with 50N force is means for the protection of person’s back of hand from hazard parts.
| Diameter of test sphere: | 50mm | Diameter of baffle: | 45mm |
| Thickness of baffle: | 4mm | Diameter of handle: | 10mm |
| Length of handle: | 100mm | Thruster (optional) : | 50N |
| Material: insulating material (handle and baffle), metal (test sphere) | |||
2). test probe 1 (Sphere: Φ50) for IP10 test
Test probe 1 (500g test sphere) is designed according to IEC61032 figure 5, meet the requirement of IEC60529-IP. The diameter of the sphere is 50mm+0.05. Test probe 1 is for IP1X testing, it means for the protection against solid foreign objects of Φ50mm or greater.
| Diameter of sphere | 50mm+0.05 |
| Weight of the sphere | 500g |
| Material | steel |
3). test probe B (Jointed test finger) for IP2X test
Introduction:
Test probe B ( jointed test finger) is design according to IEC61032 figure 2, meet the requirements of UL507, UL1278 figure 8 and EN60529 figure 2. Test probe B with 10N force is for IP2X testing, it means for the protection of person’s finger from hazard parts.
| Model | PG-TPB |
| Jointed point size 1 | 30±0.2 |
| Jointed point size 2 | 60±0.2 |
| Length of finger | 80±0.2 |
| Fingertip to baffle size | 180±0.2 |
| Fingertip taper fillet | S4±0.05 |
| Diameter of finger | Ф12 0 -0.05 |
| Diameter of baffle | Ф75±0.2 |
| Thickness of baffle | 5±0.5 |
| A-A section diameter | Ф50 |
| A-A section width | Ф20±0.2 |
| Thruster | 10N optional |
| Standard | IEC61032 |
4. test probe C (Rod: Φ2.5-length 100) for IP3X test
Test probe C (test rod) Designed according to IEC61032 figure 3, meet the requirements of IEC60529-IP3, IEC60065,IEC60598 and etc.
Test probe C is for IP3X testing, it means for the protection against solid foreign objects of Φ2.5mm and greater. Test probe C with 3N force is for IP3X testing, it means for the protection of person’s tool from hazard parts.
| Length of test rod: | 100mm | Diameter of test rod: | 2.5mm |
| Diameter of stop sphere: | 35mm | Diameter of handle: | 10mm |
| Length of handle: | 100mm | Thruster (optional): | 3N |
| Material: Insulating material (handle, sphere), metal (test rod) | |||
5.test probe D (Wire: Φ1.0-length 100) for IP4X
Test probe D (Test wire) Designed according to IEC61032 figure 4, meet the requirements of IEC60529-IP3,IEC60065,IEC60598 and etc.
Test probe D is for IP4X testing, it means for the protection against solid foreign objects of Φ1.0mm and greater. Test probe D with 1N force is for IP4X testing, it means for the protection of person’s wire from hazard parts.
| Length of test wire: | 100mm | Diameter of test wire: | 1mm |
| Diameter of stop sphere: | 35mm | Diameter of handle: | 10mm |
| Length of handle: | 100mm | Thruster (optional) | 1N |
| Material: Insulation material (handle, stop sphere), metal (test wire) | |||
6. test probe 2 (Sphere: Φ12.5) for IP20 test
Test probe 2 (15g test sphere) Designed according to IEC61032 figure 6, meet the requirement of IEC60529-IP2. The diameter of sphere is 12.5+0.2. Test probe 2 is for IP2X testing, it means for the protection against solid foreign objects of Φ12.5mm or greater.
| Diameter of sphere | 12.5mm+0.05 |
| Weight of the sphere | 15g |
| Material | steel |
Company Details
Business Type:
Manufacturer,Distributor/Wholesaler,Exporter,Trading Company
Year Established:
2014
Ecer Certification：
Verified Supplier
Pego Electronics is founded by PEGO GROUP in 2011, a professional high-tech enterprise engaged in developing, marketing and service for electronic test equipment. Our business scope includes IP testing equipment, dust chamber, pendulum and vertical impact testing equipment, flame test apparatus,&nbs... Pego Electronics is founded by PEGO GROUP in 2011, a professional high-tech enterprise engaged in developing, marketing and service for electronic test equipment. Our business scope includes IP testing equipment, dust chamber, pendulum and vertical impact testing equipment, flame test apparatus,&nbs...
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